Instituto de Microscopía Electrónica y Materiales (IMEYMAT)
Instituto de investigación
Purdue University
West Lafayette, Estados UnidosPublicacións en colaboración con investigadores/as de Purdue University (17)
2024
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Data-driven autoencoder neural network for onboard BMS Lithium-ion battery degradation prediction
Journal of Energy Storage, Vol. 82
2023
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Direct measurement of internal temperatures of commercially-available 18650 lithium-ion batteries
Scientific Reports, Vol. 13, Núm. 1
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Micromechanical properties and microstructures of AC and DC flash-sintered alumina
Materials Science and Engineering A, Vol. 866
2022
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Artificial intelligence inferred microstructural properties from voltage–capacity curves
Scientific Reports, Vol. 12, Núm. 1
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Grain boundary metal–insulator transitions in polycrystalline LiCoO2
Journal of Power Sources, Vol. 547
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Interfacial and volumetric melting regimes of Sn nanoparticles
Acta Materialia, Vol. 235
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Machine learning of phase diagrams
Materials Advances, Vol. 3, Núm. 23, pp. 8485-8497
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Physics-based, reduced order degradation model of lithium-ion batteries
Journal of Power Sources, Vol. 545
2021
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Data driven analytics of porous battery microstructures
Energy and Environmental Science, Vol. 14, Núm. 4, pp. 2485-2493
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Electric field-induced grain boundary degradation mechanism in yttria stabilized zirconia
Scripta Materialia, Vol. 204
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Field-assisted growth of one-dimensional ZnO nanostructures with high defect density
Nanotechnology, Vol. 32, Núm. 9
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Microstructural phase coexistence kinetics near the polymorphic phase boundary
Acta Materialia, Vol. 206
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Modeling of flash sintering of ionic ceramics
MRS Bulletin, Vol. 46, Núm. 1, pp. 67-75
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Physics-based optimization of Landau parameters for ferroelectrics: Application to BZT-50BCT
Modelling and Simulation in Materials Science and Engineering, Vol. 29, Núm. 7
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Thermodynamically consistent variational principles for charged interfaces
Acta Materialia, Vol. 205
2010
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A methodology to improve yield in analog circuits by using geometric programming
SBCCI'10 - Proceedings of the 23rd Symposium on Integrated Circuits and Systems Design
2006
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Applications of atomic scale scanning transmission electron microscopy
Microscopy and Microanalysis