Instituto de investigación
Instituto de Microscopía Electrónica y Materiales (IMEYMAT)
Capítulos de Libro (8) Publicaciones en las que ha participado algún/a investigador/a
2018
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Comparison of the thickness determined by fresnel contrast and rutherford backscattering spectrometry in ultra-thin layers
Microscopy of Semiconducting Materials 2003 (CRC Press), pp. 305-308
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Device formation and the characterizations
Power Electronics Device Applications of Diamond Semiconductors (Elsevier), pp. 295-382
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Influence of temperature and doping content on the photocatalytic activity in visible light of w-doped tio2
Advances in Science, Technology and Innovation (Springer Nature), pp. 153-154
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Insights into the Photovoltaic and Photocatalytic Activity of Cu‐, Al‐, and Tm‐Doped TiO <sub>2</sub>
Emerging Photovoltaic Materials (Santosh K. Kurinec), pp. 165-194
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Microreaction chambers
Smart Sensors and MEMS: Intelligent Sensing Devices and Microsystems for Industrial Applications: Second Edition (Elsevier Inc.), pp. 355-375
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Neural networks applied to the determination of thickness and defocus from high resolution transmission electron microscopy images
Microscopy of Semiconducting Materials 2003 (CRC Press), pp. 23-26
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Organic–Inorganic Hybrid Perovskite, CH <sub>3</sub> NH <sub>3</sub> PbI <sub>3</sub>: Modifications in Pb Sites from Experimental and Theoretical Perspectives
Emerging Photovoltaic Materials (Santosh K. Kurinec), pp. 357-400
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Preserving cultural heritage stone: Innovative consolidant, superhydrophobic, self-cleaning, and biocidal products
Advanced Materials for the Conservation of Stone (Springer International Publishing), pp. 259-275