Aportaciones congreso (17) Publicaciones en las que ha participado algún/a investigador/a

1994

  1. A STUDY OF THE DEFECT STRUCTURE IN GAAS1-XPX/GAAS ASX-LESS-THAN-0.25

    MECHANISMS OF THIN FILM EVOLUTION

  2. A transmission electron microscopy study of the effect of a dopant addition in a 3:2 mullite

    ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B

  3. CATHODOLUMINESCENCE AND TRANSMISSION ELECTRON-MICROSCOPY STUDY OF ISLAND FORMATION ON INAS/INP QW STRUCTURES DURING GROWTH INTERRUPTIONS

    DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS AND DEVICES

  4. CdSe nanocrystals formation in silica sonogels

    Materials Research Society Symposium - Proceedings

  5. DISLOCATION DISTRIBUTION IN GRADED COMPOSITION INGAAS LAYERS

    PHYSICS AND APPLICATIONS OF DEFECTS IN ADVANCED SEMICONDUCTORS

  6. Development of acidity on sol-gel prepared TiO2-SiO2 catalysts

    Materials Research Society Symposium - Proceedings

  7. Dislocation distribution in graded composition InGaAs layers

    Materials Research Society Symposium Proceedings

  8. HREM applied to the characterization of supported metal catalysts. Study of metal decoration effects

    ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B

  9. HREM image simulation of metal/oxide catalysts: Development of a modelling program

    ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B

  10. HRTEM AND TPO STUDY OF THE BEHAVIOR UNDER OXIDIZING CONDITIONS OF SOME RH/CEO2 CATALYSTS

    NEW DEVELOPMENTS IN SELECTIVE OXIDATION II

  11. Multilayer strain relaxation determination by XTEM in InGaAs step graded structures

    ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B

  12. SEM and EDX study of LaCl3 inhibition role on AISI430 corrosion

    ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B

  13. Structural disorder and thermal dilatation behavior in Cr-doped mullite

    Materials Research Society Symposium - Proceedings

  14. Study of the defects structure in GaAs1-xPx/GaAs as x<0.25

    Materials Research Society Symposium Proceedings

  15. TEM CHARACTERIZATION OF GAAS PIN DIODES AT LOW-TEMPERATURES ON SI SUBSTRATES

    GROWTH, PROCESSING, AND CHARACTERIZATION OF SEMICONDUCTOR HETEROSTRUCTURES

  16. TEM characterization of GaAs pin diodes at low temperatures on Si substrates

    Materials Research Society Symposium Proceedings

  17. TEM study of dislocation distribution in linearly-graded composition InGaAs layers on GaAs(001)

    ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B