Instituto de investigación
Instituto de Microscopía Electrónica y Materiales (IMEYMAT)
Aportaciones congreso (17) Publicaciones en las que ha participado algún/a investigador/a
1994
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A STUDY OF THE DEFECT STRUCTURE IN GAAS1-XPX/GAAS ASX-LESS-THAN-0.25
MECHANISMS OF THIN FILM EVOLUTION
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A transmission electron microscopy study of the effect of a dopant addition in a 3:2 mullite
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B
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CATHODOLUMINESCENCE AND TRANSMISSION ELECTRON-MICROSCOPY STUDY OF ISLAND FORMATION ON INAS/INP QW STRUCTURES DURING GROWTH INTERRUPTIONS
DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS AND DEVICES
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CdSe nanocrystals formation in silica sonogels
Materials Research Society Symposium - Proceedings
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DISLOCATION DISTRIBUTION IN GRADED COMPOSITION INGAAS LAYERS
PHYSICS AND APPLICATIONS OF DEFECTS IN ADVANCED SEMICONDUCTORS
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Development of acidity on sol-gel prepared TiO2-SiO2 catalysts
Materials Research Society Symposium - Proceedings
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Dislocation distribution in graded composition InGaAs layers
Materials Research Society Symposium Proceedings
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HREM applied to the characterization of supported metal catalysts. Study of metal decoration effects
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B
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HREM image simulation of metal/oxide catalysts: Development of a modelling program
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B
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HRTEM AND TPO STUDY OF THE BEHAVIOR UNDER OXIDIZING CONDITIONS OF SOME RH/CEO2 CATALYSTS
NEW DEVELOPMENTS IN SELECTIVE OXIDATION II
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Multilayer strain relaxation determination by XTEM in InGaAs step graded structures
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B
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SEM and EDX study of LaCl3 inhibition role on AISI430 corrosion
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B
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Structural disorder and thermal dilatation behavior in Cr-doped mullite
Materials Research Society Symposium - Proceedings
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Study of the defects structure in GaAs1-xPx/GaAs as x<0.25
Materials Research Society Symposium Proceedings
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TEM CHARACTERIZATION OF GAAS PIN DIODES AT LOW-TEMPERATURES ON SI SUBSTRATES
GROWTH, PROCESSING, AND CHARACTERIZATION OF SEMICONDUCTOR HETEROSTRUCTURES
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TEM characterization of GaAs pin diodes at low temperatures on Si substrates
Materials Research Society Symposium Proceedings
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TEM study of dislocation distribution in linearly-graded composition InGaAs layers on GaAs(001)
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B