Experimental and simulated strain field maps in stacked quantum wires

  1. Ben, T.
  2. Sales, D.L.
  3. Pizarro, J.
  4. Galindo, P.L.
  5. Fuster, D.
  6. González, Y.
  7. González, L.
  8. Varela, M.
  9. Pennycook, S.J.
  10. Molina, S.I.
Revue:
Microscopy and Microanalysis

ISSN: 1431-9276 1435-8115

Année de publication: 2008

Volumen: 14

Número: SUPPL. 2

Pages: 344-345

Type: Communication dans un congrès

DOI: 10.1017/S1431927608087084 GOOGLE SCHOLAR