In-depth multi-technique characterization of chromium-silicon mixed oxides produced by reactive ion beam mixing of the Cr/Si interface

1. Escobar Galindo, R.
2. Benito, N.
3. Duday, D.
4. Fuentes, G.G.
5. Valle, N.
6. Herrero, P.
7. Vergara, L.
8. Joco, V.
9. Sanchez, O.
10. Arranz, A.
11. Palacio, C.