Structural and electrical properties of the glassy semiconductor system Cu-As-Te - Part 2 Structural analysis by X-ray diffraction and space models
- Vázquez, J.
- Márquez, E.
- De La Rosa-Fox, N.
- Villares, P.
- Jiménez-Garay, R.
ISSN: 0022-2461, 1573-4803
Year of publication: 1988
Volume: 23
Issue: 5
Pages: 1709-1717
Type: Article