Structural and electrical properties of the glassy semiconductor system Cu-As-Te - Part 2 Structural analysis by X-ray diffraction and space models

  1. Vázquez, J.
  2. Márquez, E.
  3. De La Rosa-Fox, N.
  4. Villares, P.
  5. Jiménez-Garay, R.
Journal:
Journal of Materials Science

ISSN: 0022-2461,  1573-4803

Year of publication: 1988

Volume: 23

Issue: 5

Pages: 1709-1717

Type: Article

DOI: 10.1007/BF01115710 GOOGLE SCHOLAR
Data source: Scopus