Structural and electrical properties of the glassy semiconductor system Cu-As-Te - Part 2 Structural analysis by X-ray diffraction and space models

  1. Vázquez, J.
  2. Márquez, E.
  3. De La Rosa-Fox, N.
  4. Villares, P.
  5. Jiménez-Garay, R.
Revue:
Journal of Materials Science

ISSN: 0022-2461,  1573-4803

Année de publication: 1988

Volumen: 23

Número: 5

Pages: 1709-1717

Type: Article

DOI: 10.1007/BF01115710 GOOGLE SCHOLAR

Objetivos de desarrollo sostenible

La source de données: Scopus