An ellipsometric analysis to model the order-disorder transition in Au-SiO2 nano-granular thin films induced by thermal annealing
- Bakkali, H.
- Blanco, E.
- Amrani, M.
- Brigui, J.
- Domínguez, M.
Aldizkaria:
Thin Solid Films
ISSN: 0040-6090
Argitalpen urtea: 2018
Alea: 660
Orrialdeak: 455-462
Mota: Artikulua