Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction
- Carvalho, D.
- Müller-Caspary, K.
- Schowalter, M.
- Grieb, T.
- Mehrtens, T.
- Rosenauer, A.
- Ben, T.
- García, R.
- Redondo-Cubero, A.
- Lorenz, K.
- Daudin, B.
- Morales, F.M.
Aldizkaria:
Scientific Reports
ISSN: 2045-2322
Argitalpen urtea: 2016
Alea: 6
Mota: Artikulua