Inline electron holography and VEELS for the measurement of strain in ternary and quaternary (In,Al,Ga)N alloyed thin films and its effect on bandgap energy

  1. Mánuel, J.M.
  2. Koch, C.T.
  3. Özdöl, V.B.
  4. Sigle, W.
  5. Van Aken, P.A.
  6. García, R.
  7. Morales, F.M.
Journal:
Journal of Microscopy

ISSN: 1365-2818 0022-2720

Year of publication: 2016

Volume: 261

Issue: 1

Pages: 27-35

Type: Article

DOI: 10.1111/JMI.12312 GOOGLE SCHOLAR