Raman study of structural defects in SiO2 aerogels

  1. Woignier, T.
  2. Fernandez-Lorenzo, C.
  3. Sauvajol, J.L.
  4. Schmit, J.F.
  5. Phalippou, J.
  6. Sempere, R.
Revue:
Journal of Sol-Gel Science and Technology

ISSN: 0928-0707,  1573-4846

Année de publication: 1995

Volumen: 5

Número: 3

Pages: 167-172

Type: Article

DOI: 10.1007/BF00487013 GOOGLE SCHOLAR
La source de données: Scopus