TEM study of defects versus growth orientations in heavily boron-doped diamond
- Lloret, F.
- Araujo, D.
- Alegre, M.P.
- Gonzalez-Leal, J.M.
- Villar, M.P.
- Eon, D.
- Bustarret, E.
ISSN: 1862-6319, 1862-6300
Année de publication: 2015
Volumen: 212
Número: 11
Pages: 2468-2473
Type: Article