Electro-optical characterisation for the control of silicon nanocrystals embedded in SiNx:H films

  1. Lelièvre, J.-F.
  2. Rodriguez, H.
  3. Fourmond, E.
  4. Quoizola, S.
  5. Lipinski, M.
  6. Araujo, D.
  7. Bremond, G.
  8. Lemiti, M.
Journal:
Physica Status Solidi (C) Current Topics in Solid State Physics

ISSN: 1862-6351

Year of publication: 2007

Volume: 4

Issue: 4

Pages: 1554-1559

Type: Conference paper

DOI: 10.1002/PSSC.200674142 GOOGLE SCHOLAR
Data source: Scopus