Comparative study of the accuracy of characterization of thin films a-Si on glass substrates from their interference normal incidence transmittance spectrum by the Tauc-Lorentz-Urbach, the Cody-Lorentz-Urbach, the optimized envelopes and the optimized graphical methods

1. Minkov, D.A.
2. Angelov, G.V.
3. Nestorov, R.N.
4. Marquez, E.
5. Blanco, E.
6. Ruiz-Perez, J.J.