Effect of dislocations on electrical and electron transport properties of InN thin films. II. Density and mobility of the carriers
- Lebedev, V.
- Cimalla, V.
- Baumann, T.
- Ambacher, O.
- Morales, F.M.
- Lozano, J.G.
- González., D.
Zeitschrift:
Journal of Applied Physics
ISSN: 0021-8979
Datum der Publikation: 2006
Ausgabe: 100
Nummer: 9
Art: Artikel