Effect of dislocations on electrical and electron transport properties of InN thin films. II. Density and mobility of the carriers

  1. Lebedev, V.
  2. Cimalla, V.
  3. Baumann, T.
  4. Ambacher, O.
  5. Morales, F.M.
  6. Lozano, J.G.
  7. González., D.
Journal:
Journal of Applied Physics

ISSN: 0021-8979

Year of publication: 2006

Volume: 100

Issue: 9

Type: Article

DOI: 10.1063/1.2363234 GOOGLE SCHOLAR
Data source: Scopus