Dual-axis STEM tomography of Dy-doped YBa2Cu3O7-x coated superconductors

  1. Ortalan, V.
  2. Herrera, M.
  3. Morgan, D.G.
  4. Rupich, M.W.
  5. Browning, N.D.
Revue:
Microscopy and Microanalysis

ISSN: 1431-9276,  1435-8115

Année de publication: 2008

Volumen: 14

Número: SUPPL. 2

Pages: 340-341

Type: Communication dans un congrès

DOI: 10.1017/S1431927608085930 GOOGLE SCHOLAR
La source de données: Scopus