Perfecting the dispersion model free characterization of a thin film on a substrate specimen from its normal incidence interference transmittance spectrum
- Minkov, D.A.
- Angelov, G.V.
- Nestorov, R.N.
- Marquez, E.
Zeitschrift:
Thin Solid Films
ISSN: 0040-6090
Datum der Publikation: 2020
Ausgabe: 706
Art: Artikel