Perfecting the dispersion model free characterization of a thin film on a substrate specimen from its normal incidence interference transmittance spectrum
- Minkov, D.A.
- Angelov, G.V.
- Nestorov, R.N.
- Marquez, E.
Revue:
Thin Solid Films
ISSN: 0040-6090
Année de publication: 2020
Volumen: 706
Type: Article