Transmission electron microscopy study of Si δ-doped GaAs/AlGaAs/InGaAs/GaAs pseudomorphic high electron mobility transistor structures

  1. Molina, S.I.
  2. Walther, T.
Revue:
Thin Solid Films

ISSN: 0040-6090

Année de publication: 1997

Volumen: 307

Número: 1-2

Pages: 6-9

Type: Article

DOI: 10.1016/S0040-6090(97)00245-9 GOOGLE SCHOLAR
La source de données: Scopus