A new algorithm for the selection of control cells in boundary-scan interconnect test

  1. Quiros-Olozabal, A.
  2. Cifredo-Chacon, M.A.
Aldizkaria:
Journal of Electronic Testing: Theory and Applications (JETTA)

ISSN: 0923-8174 1573-0727

Argitalpen urtea: 2009

Alea: 25

Zenbakia: 2-3

Orrialdeak: 187-195

Mota: Artikulua

DOI: 10.1007/S10836-008-5091-1 GOOGLE SCHOLAR