STEM-EELS analysis reveals stable high-density He in nanopores of amorphous silicon coatings deposited by magnetron sputtering
- Schierholz, R.
- Lacroix, B.
- Godinho, V.
- Caballero-Hernández, J.
- Duchamp, M.
- Fernández, A.
ISSN: 1361-6528, 0957-4484
Any de publicació: 2015
Volum: 26
Número: 7
Tipus: Article