STEM-EELS analysis reveals stable high-density He in nanopores of amorphous silicon coatings deposited by magnetron sputtering
- Schierholz, R.
- Lacroix, B.
- Godinho, V.
- Caballero-Hernández, J.
- Duchamp, M.
- Fernández, A.
ISSN: 1361-6528, 0957-4484
Datum der Publikation: 2015
Ausgabe: 26
Nummer: 7
Art: Artikel