Defect evolution and interplay in n-type InN
- Rauch, C.
- Tuomisto, F.
- Vilalta-Clemente, A.
- Lacroix, B.
- Ruterana, P.
- Kraeusel, S.
- Hourahine, B.
- Schaff, W.J.
Revue:
Applied Physics Letters
ISSN: 0003-6951
Année de publication: 2012
Volumen: 100
Número: 9
Type: Article