Mechanisms of damage formation in Eu-implanted GaN probed by X-ray diffraction

  1. Lacroix, B.
  2. Leclerc, S.
  3. Declémy, A.
  4. Lorenz, K.
  5. Alves, E.
  6. Ruterana, P.
Aldizkaria:
EPL

ISSN: 0295-5075,  1286-4854

Argitalpen urtea: 2011

Alea: 96

Zenbakia: 4

Mota: Artikulua

DOI: 10.1209/0295-5075/96/46002 GOOGLE SCHOLAR
Datuen iturria: Scopus