Mechanisms of damage formation in Eu-implanted GaN probed by X-ray diffraction
- Lacroix, B.
- Leclerc, S.
- Declémy, A.
- Lorenz, K.
- Alves, E.
- Ruterana, P.
ISSN: 0295-5075, 1286-4854
Année de publication: 2011
Volumen: 96
Número: 4
Type: Article
ISSN: 0295-5075, 1286-4854
Année de publication: 2011
Volumen: 96
Número: 4
Type: Article