Crystal defects and related stress in Y2O3 thin films: Origin, modeling, and consequence on the stability of the C-type structure
- Lacroix, B.
- Paumier, F.
- Gaboriaud, R.J.
ISSN: 1098-0121, 1550-235X
Datum der Publikation: 2011
Ausgabe: 84
Nummer: 1
Art: Artikel