Crystal defects and related stress in Y2O3 thin films: Origin, modeling, and consequence on the stability of the C-type structure

  1. Lacroix, B.
  2. Paumier, F.
  3. Gaboriaud, R.J.
Aldizkaria:
Physical Review B - Condensed Matter and Materials Physics

ISSN: 1098-0121,  1550-235X

Argitalpen urtea: 2011

Alea: 84

Zenbakia: 1

Mota: Artikulua

DOI: 10.1103/PHYSREVB.84.014104 GOOGLE SCHOLAR
Datuen iturria: Scopus