High-resolution TEM and the application of direct and indirect aberration correction

  1. Hetherington, C.J.D.
  2. Chang, L.-Y.S.
  3. Haigh, S.
  4. Nellist, P.D.
  5. Gontard, L.C.
  6. Dunin-Borkowski, R.E.
  7. Kirkland, A.I.
Aldizkaria:
Microscopy and Microanalysis

ISSN: 1431-9276,  1435-8115

Argitalpen urtea: 2008

Alea: 14

Zenbakia: 1

Orrialdeak: 60-67

Mota: Artikulua

DOI: 10.1017/S1431927608080148 GOOGLE SCHOLAR
Datuen iturria: Scopus