High-resolution TEM and the application of direct and indirect aberration correction
- Hetherington, C.J.D.
- Chang, L.-Y.S.
- Haigh, S.
- Nellist, P.D.
- Gontard, L.C.
- Dunin-Borkowski, R.E.
- Kirkland, A.I.
ISSN: 1431-9276, 1435-8115
Année de publication: 2008
Volumen: 14
Número: 1
Pages: 60-67
Type: Article