A robust SVM-based approach with feature selection and outliers detection for classification problems

  1. Baldomero-Naranjo, M.
  2. Martínez-Merino, L.I.
  3. Rodríguez-Chía, A.M.
Aldizkaria:
Expert Systems with Applications

ISSN: 0957-4174

Argitalpen urtea: 2021

Alea: 178

Mota: Artikulua

DOI: 10.1016/J.ESWA.2021.115017 GOOGLE SCHOLAR
Datuen iturria: Scopus