Developing and Evaluating Deep Neural Network-Based Denoising for Nanoparticle TEM Images with Ultra-Low Signal-to-Noise

  1. Vincent, J.L.
  2. Manzorro, R.
  3. Mohan, S.
  4. Tang, B.
  5. Sheth, D.Y.
  6. Simoncelli, E.P.
  7. Matteson, D.S.
  8. Fernandez-Granda, C.
  9. Crozier, P.A.
Journal:
Microscopy and Microanalysis

ISSN: 1435-8115,  1431-9276

Year of publication: 2021

Volume: 27

Issue: 6

Pages: 1431-1447

Type: Article

DOI: 10.1017/S1431927621012678 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus