Developing and Evaluating Deep Neural Network-Based Denoising for Nanoparticle TEM Images with Ultra-Low Signal-to-Noise

  1. Vincent, J.L.
  2. Manzorro, R.
  3. Mohan, S.
  4. Tang, B.
  5. Sheth, D.Y.
  6. Simoncelli, E.P.
  7. Matteson, D.S.
  8. Fernandez-Granda, C.
  9. Crozier, P.A.
Aldizkaria:
Microscopy and Microanalysis

ISSN: 1435-8115,  1431-9276

Argitalpen urtea: 2021

Alea: 27

Zenbakia: 6

Orrialdeak: 1431-1447

Mota: Artikulua

DOI: 10.1017/S1431927621012678 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus