Surface characterization of Ti-Si-C-ON coatings for orthopedic devices: XPS and Raman spectroscopy

  1. Oliveira, C.
  2. Galindo, R.E.
  3. Palacio, C.
  4. Calderon V, S.
  5. Almeida, B.G.
  6. Henriques, M.
  7. Espinosa, A.
  8. Carvalho, S.
Aldizkaria:
Solid State Sciences

ISSN: 1293-2558

Argitalpen urtea: 2011

Alea: 13

Zenbakia: 1

Orrialdeak: 95-100

Mota: Artikulua

DOI: 10.1016/J.SOLIDSTATESCIENCES.2010.10.015 GOOGLE SCHOLAR
Datuen iturria: Scopus