STEM Tools for Semiconductor Characterization: Beyond High-Resolution Imaging

  1. de la Mata, M.
  2. Molina, S.I.
Journal:
Nanomaterials

ISSN: 2079-4991

Year of publication: 2022

Volume: 12

Issue: 3

Type: Review

DOI: 10.3390/NANO12030337 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus