Exploring Blob Detection to Determine Atomic Column Positions and Intensities in Time-Resolved TEM Images with Ultra-Low Signal-to-Noise

  1. Manzorro, R.
  2. Xu, Y.
  3. Vincent, J.L.
  4. Rivera, R.
  5. Matteson, D.S.
  6. Crozier, P.A.
Zeitschrift:
Microscopy and Microanalysis

ISSN: 1435-8115 1431-9276

Datum der Publikation: 2022

Ausgabe: 28

Nummer: 6

Seiten: 1917-1930

Art: Artikel

DOI: 10.1017/S1431927622000356 GOOGLE SCHOLAR lock_openOpen Access editor