Exploring Blob Detection to Determine Atomic Column Positions and Intensities in Time-Resolved TEM Images with Ultra-Low Signal-to-Noise

  1. Manzorro, R.
  2. Xu, Y.
  3. Vincent, J.L.
  4. Rivera, R.
  5. Matteson, D.S.
  6. Crozier, P.A.
Aldizkaria:
Microscopy and Microanalysis

ISSN: 1435-8115,  1431-9276

Argitalpen urtea: 2022

Alea: 28

Zenbakia: 6

Orrialdeak: 1917-1930

Mota: Artikulua

DOI: 10.1017/S1431927622000356 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus