Structural characterization of GaN/AlN/Si (111)
- Molina, SI
- Sanchez, AM
- Sanchez-Garcia, MA
- Calleja, E
- Calle, F
- Garcia, R
- Benavides, HAC (coord.)
- Yacaman, MJ (coord.)
ISBN: 0-7503-0566-5
Datum der Publikation: 1998
Seiten: 389-390
Kongress: 14th International Congress on Electron Microscopy
Art: Konferenz-Beitrag