Multilayer strain relaxation determination by XTEM in InGaAs step graded structures
- GONZALEZ, D
- ARAUJO, D
- MOLINA, SI
- PACHECO, FJ
- ARAGON, G
- GONZALEZ, L
- GONZALEZ, Y
- KIDD, P
- GARCIA, R
- Jouffrey, B (coord.)
- Colliex, C (coord.)
ISBN: 2-86883-226-1
Year of publication: 1994
Pages: 607-608
Congress: 13th International Congress on Electron Microscopy
Type: Conference paper