Multilayer strain relaxation determination by XTEM in InGaAs step graded structures

  1. GONZALEZ, D
  2. ARAUJO, D
  3. MOLINA, SI
  4. PACHECO, FJ
  5. ARAGON, G
  6. GONZALEZ, L
  7. GONZALEZ, Y
  8. KIDD, P
  9. GARCIA, R
Liburua:
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B
  1. Jouffrey, B (coord.)
  2. Colliex, C (coord.)

ISBN: 2-86883-226-1

Argitalpen urtea: 1994

Orrialdeak: 607-608

Biltzarra: 13th International Congress on Electron Microscopy

Mota: Biltzar ekarpena

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Datuen iturria: WoS