Neural networks applied to the determination of thickness and defocus from high resolution transmission electron microscopy images

  1. Galindo, PL
  2. Ponce, A
  3. Molina, SI
Büchersammlung:
MICROSCOPY OF SEMICONDUCTING MATERIALS 2003
  1. Cullis, AG (coord.)
  2. Midgley, PA (coord.)

ISSN: 0951-3248

ISBN: 0-7503-0979-2

Datum der Publikation: 2003

Seiten: 23-26

Kongress: Conference on Microscopy of Semiconducting Materials

Art: Konferenz-Beitrag

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Fuente de los datos: WoS