Neural networks applied to the determination of thickness and defocus from high resolution transmission electron microscopy images

  1. Galindo, PL
  2. Ponce, A
  3. Molina, SI
Collection de livres:
MICROSCOPY OF SEMICONDUCTING MATERIALS 2003
  1. Cullis, AG (coord.)
  2. Midgley, PA (coord.)

ISSN: 0951-3248

ISBN: 0-7503-0979-2

Année de publication: 2003

Pages: 23-26

Congreso: Conference on Microscopy of Semiconducting Materials

Type: Communication dans un congrès

GOOGLE SCHOLAR
La source de données: WoS