Characterization of InGaAs (N)/GaAsN multi-quantum wells using transmission electron microscopy
- Gutierrez, M
- Herrera, M
- Ross, I
- Gonzalez, D
- Hopkinson, M
- Garcia, R
- Cullis, AG (coord.)
- Midgley, PA (coord.)
ISSN: 0951-3248
ISBN: 0-7503-0979-2
Year of publication: 2003
Pages: 143-146
Congress: Conference on Microscopy of Semiconducting Materials
Type: Conference paper