CMBMeTest: Generation of Test Suites Using Model-Based Testing Plus Constraint Programming and Metamorphic Testing

  1. Castro-Cabrera, M.C.D.
  2. García-Dominguez, A.
  3. Medina-Bulo, I.
Aldizkaria:
Electronics (Switzerland)

ISSN: 2079-9292

Argitalpen urtea: 2024

Alea: 13

Zenbakia: 1

Mota: Artikulua

DOI: 10.3390/ELECTRONICS13010018 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus