CMBMeTest: Generation of Test Suites Using Model-Based Testing Plus Constraint Programming and Metamorphic Testing

  1. Castro-Cabrera, M.C.D.
  2. García-Dominguez, A.
  3. Medina-Bulo, I.
Revue:
Electronics (Switzerland)

ISSN: 2079-9292

Année de publication: 2024

Volumen: 13

Número: 1

Type: Article

DOI: 10.3390/ELECTRONICS13010018 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus