Publikationen, an denen er mitarbeitet Giovanni Scavello (2)

2014

  1. A methodology for the extraction of quantitative information from electron microscopy images at the atomic level

    Journal of Physics: Conference Series

  2. Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging

    Ultramicroscopy, Vol. 146, pp. 33-38