MIRIAM
HERRERA COLLADO
Catedrática de Universidad
JOAQUIN
PIZARRO JUNQUERA
Profesor Titular de Universidad
JOAQUIN PIZARRO JUNQUERA-rekin lankidetzan egindako argitalpenak (16)
2020
-
Effect of the cap layer growth temperature on the Sb distribution in InAs/InSb/InAs sub-monolayer heterostructures for mid-infrared devices
Nanotechnology, Vol. 31, Núm. 10
-
Investigation on Sb distribution for InSb/InAs sub-monolayer heterostructure using TEM techniques
Nanotechnology, Vol. 31, Núm. 2
2019
-
Effect of the thermal annealing and the nominal composition in the elemental distribution of InxAl1-xAsySb1-y for triple junction solar cells
Journal of Alloys and Compounds, Vol. 792, pp. 1021-1027
-
Modified qHAADF method for atomic column-by-column compositional quantification of semiconductor heterostructures
Journal of Materials Science, Vol. 54, Núm. 4, pp. 3230-3241
2018
-
Gaussian kernel density functions for compositional quantification in atom probe tomography
Materials Characterization, Vol. 139, pp. 63-69
-
HAADF-STEM for the analysis of core–shell quantum dots
Journal of Materials Science, Vol. 53, Núm. 21, pp. 15226-15236
-
Influence of the growth temperature on the composition distribution at sub-nm scale of InAlAsSb for solar cells
Journal of Alloys and Compounds, Vol. 763, pp. 1005-1011
2017
-
Structural and Compositional Analysis of Core/Shell QDs by Transmission Electron Microscopy Techniques
Microscopy & Microanalysis 2017
-
Structural characterization of InAlAsSb/InGaAs/InP heterostructures for solar cells
Applied Surface Science, Vol. 395, pp. 98-104
2014
-
A methodology for the extraction of quantitative information from electron microscopy images at the atomic level
Journal of Physics: Conference Series
2012
-
High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures
Springer Series in Materials Science (Springer Science and Business Media Deutschland GmbH), pp. 23-62
2011
-
Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy
Microscopy and Microanalysis, Vol. 17, Núm. 4, pp. 578-581
-
Reduction of Channeling Effects in Aberration-Corrected STEM by Orientating the Sample Along Low Atomic Linear Density Zone Axes
Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
2010
-
Transmission electron microscopy study of vertical quantum dots molecules grown by droplet epitaxy
Applied Surface Science, Vol. 256, Núm. 18, pp. 5659-5661
2009
-
Atomic scale high-angle annular dark field STEM analysis of the N configuration in dilute nitrides of GaAs
Physical Review B - Condensed Matter and Materials Physics, Vol. 80, Núm. 12
2008
-
High resolution HAADF-STEM imaging analysis of N related defects in GaNAs quantum wells
Microscopy and Microanalysis