Giovanni Scavello-rekin lankidetzan egindako argitalpenak (3)

2014

  1. A methodology for the extraction of quantitative information from electron microscopy images at the atomic level

    Journal of Physics: Conference Series

  2. Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging

    Ultramicroscopy, Vol. 146, pp. 33-38

2012

  1. Quantification of corrugation in simulated graphene by electron tomography techniques

    Applied Physics Letters, Vol. 101, Núm. 21