Publicaciones en las que colabora con JOAQUIN PIZARRO JUNQUERA (30)

2020

  1. Effect of the cap layer growth temperature on the Sb distribution in InAs/InSb/InAs sub-monolayer heterostructures for mid-infrared devices

    Nanotechnology, Vol. 31, Núm. 10

  2. Investigation on Sb distribution for InSb/InAs sub-monolayer heterostructure using TEM techniques

    Nanotechnology, Vol. 31, Núm. 2

2019

  1. Effect of the thermal annealing and the nominal composition in the elemental distribution of InxAl1-xAsySb1-y for triple junction solar cells

    Journal of Alloys and Compounds, Vol. 792, pp. 1021-1027

  2. Modified qHAADF method for atomic column-by-column compositional quantification of semiconductor heterostructures

    Journal of Materials Science, Vol. 54, Núm. 4, pp. 3230-3241

2018

  1. Gaussian kernel density functions for compositional quantification in atom probe tomography

    Materials Characterization, Vol. 139, pp. 63-69

  2. HAADF-STEM for the analysis of core–shell quantum dots

    Journal of Materials Science, Vol. 53, Núm. 21, pp. 15226-15236

  3. Influence of the growth temperature on the composition distribution at sub-nm scale of InAlAsSb for solar cells

    Journal of Alloys and Compounds, Vol. 763, pp. 1005-1011

2017

  1. Structural and Compositional Analysis of Core/Shell QDs by Transmission Electron Microscopy Techniques

    Microscopy & Microanalysis 2017

  2. Structural characterization of InAlAsSb/InGaAs/InP heterostructures for solar cells

    Applied Surface Science, Vol. 395, pp. 98-104

2014

  1. A methodology for the extraction of quantitative information from electron microscopy images at the atomic level

    Journal of Physics: Conference Series

  2. Preferential sites for InAsP/InP quantum wire nucleation using molecular dynamics

    European Physical Journal B, Vol. 87, Núm. 11

2012

  1. High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

    Springer Series in Materials Science (Springer Science and Business Media Deutschland GmbH), pp. 23-62

  2. Quantification of corrugation in simulated graphene by electron tomography techniques

    Applied Physics Letters, Vol. 101, Núm. 21

2011

  1. Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy

    Microscopy and Microanalysis, Vol. 17, Núm. 4, pp. 578-581

  2. Reduction of Channeling Effects in Aberration-Corrected STEM by Orientating the Sample Along Low Atomic Linear Density Zone Axes

    Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

2010

  1. Through-focal HAADF-STEM of buried nanostructures

    Journal of Physics: Conference Series

  2. Transmission electron microscopy study of vertical quantum dots molecules grown by droplet epitaxy

    Applied Surface Science, Vol. 256, Núm. 18, pp. 5659-5661

2009

  1. Accuracy assessment of strain mapping from Z -contrast images of strained nanostructures

    Applied Physics Letters, Vol. 95, Núm. 14

2008

  1. A method to determine the strain and nucleation sites of stacked nano-objects

    Journal of Nanoscience and Nanotechnology, Vol. 8, Núm. 7, pp. 3422-3426

  2. Experimental and simulated strain field maps in stacked quantum wires

    Microscopy and Microanalysis